Description
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.
Product Details
- Published:
- 01/01/2003
- Number of Pages:
- 11
- File Size:
- 1 file , 69 KB
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JEDEC JESD 22-B108A
$26.50
COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003
